back-to-back test

基本解釋

Modern thyristor valves for HVDC are of high power rating and difficult to be tested in a conventional back-to-back test circuit.
現(xiàn)代晶閘管閥的大容量使得難以采用傳統(tǒng)的背靠背試驗(yàn)回路對(duì)其進(jìn)行運(yùn)行試驗(yàn)。
Modern power thyristor valves have a high power rating and are difficult to be tested in a conventional back-to-back test circuit.
現(xiàn)代晶閘管閥的大容量使得難以采用傳統(tǒng)的背靠背試驗(yàn)回路對(duì)其進(jìn)行運(yùn)行試驗(yàn)。
However, this synthetic test circuit offers several technical advantages and is superior to the Back-to-Back direct test circuit in terms of economy as well.
然而，這種合成試驗(yàn)回路更具有技術(shù)上的優(yōu)勢(shì)，并且在經(jīng)濟(jì)上也優(yōu)于背靠背直接試驗(yàn)回路。

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