binary diagram

基本解釋

This paper presents a testability optimization method based on free binary decision diagram transformation.
提出了一種基于自由二元判決圖轉(zhuǎn)換的可測性優(yōu)化方法。
The single-electron inverter is investigated and the unit device for Binary Dicision Diagram (BDD) is improved.
利用該模型，分析了單電子反相器和改進(jìn)了二叉判別圖基本單元。
The Binary Decision Diagram(BDD) technique which can be implemented on the computer efficiently has the characteristics of the high efficiency of calculation and precise result.
用于輔助故障樹分析的BDD（二元決策圖）技術(shù)則具有計(jì)算效率高、結(jié)果精確、并可在計(jì)算機(jī)上有效進(jìn)行計(jì)算等特點(diǎn)。