常見例句Adams J R, Coppage F N.Field oxide inversion effects in irradiated CMOS devices.IEEE Trans Nucl Sci,1976 ; 陸嫵;郭旗;任迪遠(yuǎn)等.;電離輻射對(duì)CMOS運(yùn)算放大器恒流偏置電路的影響固體電子學(xué)研究與進(jìn)展;2000; 返回 Coppage