scanning probe microscope

基本解釋

Up to now the imported commercial scanning probe microscope(SPM) has not an automatic error correcting and reducing system.
目前，我國引進(jìn)的一般商業(yè)性的SPM（掃描探針顯微鏡）中缺少誤差的自動(dòng)修正和改進(jìn)系統(tǒng)。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作為納米科技的“眼”和“手”的掃描探針顯微鏡（SPM）的測量和定位精度，是納米儀器界始終追求的目標(biāo)。
The research of scanning probe microscope(SPM) commonly used platform provides a new idea and method for developing SPM instrument, makes SPM instrument more common, open and combinative.
SPM通用平臺(tái)是一套掃描探針顯微鏡開發(fā)工具系統(tǒng)，它提供了一種開發(fā)生產(chǎn)SPM新的思路和方法，使SPM成為通用、開放、兼容的儀器體系。