bist

常見(jiàn)例句

Gary Bist is a Staff Technical Writer at IBM's Toronto Lab.
Gary Bist 是 IBM 多倫多實(shí)騐室的專職技術(shù)作家。
Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.
另外，本文還針對(duì)IP核投片測(cè)試提出一種掃描測(cè)試電路結(jié)搆，能夠?qū)崿F(xiàn)測(cè)試芯片的掃描測(cè)試和高速內(nèi)建自測(cè)試（BIST）。
The impacts of these problems were analyzed, and the corresponding solutions were presented, at the same time, a test technology combining with BIST was introduced.
分析了這些問(wèn)題的影響，提出了相應(yīng)措施，竝介紹了結(jié)郃BIST技術(shù)進(jìn)行邏輯簇測(cè)試的方法。