wafer probe

基本解釋

MMIC on-wafer probe is the key part of MMIC on-wafer measurement system.
MMIC在片測(cè)試探頭是MMIC在片測(cè)試系統(tǒng)的關(guān)鍵部件。
Can is equipped with a variety of different frequencies, different wafer size twin probe using;
可配備多種不同頻率、不同晶片尺寸的雙晶探頭使用；
Studying various pretreatment for the probe image and applying the pixel threshold selection technique to distinguish the probe from wafer and adjust the measurement position automatically.
研究了探針圖像的圖像增強(qiáng)和閾值選擇問題，識(shí)別探針竝自動(dòng)調(diào)節(jié)探針測(cè)試位置。