complex index of refraction

基本解釋

The complex index of refraction, complex dielectric constant and thickness of nanofilm at different wavelength were all measured by ellipsometer.
用橢圓偏振儀測(cè)試不同波長(zhǎng)下的復(fù)折射率和復(fù)介電常數(shù)及納米膜的厚度；
In the study of radiation characteristics of particles, computing the particulate optical constants (the complex index of refraction) is a basic issue and occupies a key position.
在粒子輻射特性的研究中，粒子的光學(xué)常數(shù)即復(fù)折射率的求解問(wèn)題占有基礎(chǔ)性的關(guān)鍵地位。
Comparing with other ways to obtain the complex refraction index of infrared absorbing thin film, such as by elliptical polarization spectrometer, this method is effective and accurate.
實(shí)踐證明，較之其它計(jì)算復(fù)折射率的方法，如橢偏譜測(cè)量法，本方法是有效和準(zhǔn)確的。