complex index of refraction

基本解釋

The complex index of refraction, complex dielectric constant and thickness of nanofilm at different wavelength were all measured by ellipsometer.
用橢圓偏振儀測(cè)試不同波長(zhǎng)下的複折射率和複介電常數(shù)及納米膜的厚度；
In the study of radiation characteristics of particles, computing the particulate optical constants (the complex index of refraction) is a basic issue and occupies a key position.
在粒子輻射特性的研究中，粒子的光學(xué)常數(shù)即複折射率的求解問(wèn)題佔(zhàn)有基礎(chǔ)性的關(guān)鍵地位。
Comparing with other ways to obtain the complex refraction index of infrared absorbing thin film, such as by elliptical polarization spectrometer, this method is effective and accurate.
實(shí)踐証明，較之其它計(jì)算複折射率的方法，如橢偏譜測(cè)量法，本方法是有傚和準(zhǔn)確的。